Spectra-Probe, Inc. is equipped with a high performance FT-IR spectrometer and the state-of-the-art IR-PLAN® microscope. Our experienced staff is committed to meeting your service needs.
Contact us for more information at one of the addresses below.
FT-IR Microscopy |
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Infrared spectroscopy involves the atomic motions of molecules. When reacting with infrared radiation, portions of the radiation are absorbed simultaneously, producing a highly complex spectrum, uniquely characteristic of the molecule and atomic configuration. This is like a fingerprint by which any molecule can be identified. FT-IR has become a method of choice for today's material analysis needs. Unfortunately, most spectroscopists face miniscule samples, often requiring involved preparation. |
Optical microscopy is a standard for all analytical/research laboratories. These micrographs reveal shape, form, color, and contrast, which can be compared to chemical compositions and physical properties. Microscopy is very popular for its diagnostic power in visible characterization of materials. However, physical characteristics are often inadequate for full analysis. |
FT-IR microscopy is the union of these two, resulting in highly versatile viewing and identification capabilities. Smaller samples can be analyzed in greater detail. The optics of an FT-IR microscope are designed to give a coincident visible light beam and infrared light beam so that the infrared specta are recorded on the exact region it is viewed. This new technology vitually eliminates sample preparation, and has proven to be complementary to optical and electron microscopy. |
Polymer Sciences/Plastics Industries
Textiles
Microelectronics
Forensic Investigation
Crystalline Substances
Material Engineering
For more information, contact us at one of the addresses below.
Spectra-Probe, Inc. 71 Middlesex Drive Slingerlands, New York 12159 USA
Voice: (518) 439-7380 |